Microwave De-embedding: Chapter 2. Millimeter-Wave Characterization of Silicon Devices under Small-Signal Regime: Instruments and Measurement Methodologies
This chapter aims to describe experimental tools and techniques used for on-wafer millimeter (mm)-wave characterizations of silicon-based devices under the small-signal regime. We discuss the basics of scattering parameters (S parameters), high-frequency (HF) noise concept and measurement facilities, and expert details concerning experimental procedures. In this chapter, we describe first the basi...
By Gilles Dambrine
File Size: 1993 KB
Print Length: 84 pages
Publisher: Academic Press (November 9, 2013)
Publication Date: November 9, 2013
Sold by: Amazon Digital Services LLC
Language: English
ASIN: B019ZUC0YE
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